I earned my PhD in 2013 at the Institute of Chemical Research of Catalonia (ICIQ) and the Universitat Rovira i Virgili (URV), in Tarragona (Spain), working under the supervision of Prof. Antoni Llobet in the study of new water oxidation electrocatalysts. After a short postdoc at the same institute, I moved to the Université de Bretagne Occidentale (UBO), in Brest (France), to carry out a second postdoc between 2014 and 2017. My research activities mainly concerned the development of electrochemical and spectroelectrochemical methods aimed at studying the redox properties of bioinorganic Cu-O2 complexes at very low temperatures (T ≤ -70°C). Then, I moved to the Université d’Angers (UA), where I made a third postdoc between 2017 and 2019. During that period, I focused on unravelling the molecular routes allowing to control the functionalization of conducting surfaces via the electrochemically triggered grafting of diazonium salts. Between 2019 and 2021, I carried out a fourth postdoc at the Université de Pau et des pays de l’Adour (UPPA) where my research activities relied on the development of reliable procedures enabling the analysis of interphases in Li solid state batteries by x-ray photoelectron spectroscopy (XPS), ToF-SIMS and Auger spectroscopies. Finally, I was recruited as maître de conferences (associate professor) at the Université de Bourgogne (UB), in Dijon (France), in 2021.
1) Reliable surface analysis.
Nowadays there is a real crisis about the actual validity of most of published surface analysis data of materials by x-ray photoelectron spectroscopy (XPS). This issue comprises the preparation of the sample, the procedure of signal recording and, of course, the interpretation of the data. An overview on these problems can be gained from the next publications: 10.1002/anie.201916000, 10.1116/6.0000685, 10.1017/S1431927619015332.
Bearing this situation in mind, one of my main research activities is devoted to the reliable analysis of the surface of materials by XPS. My approach comprises all the steps necessaries for extracting useful information from XPS data. In order to accomplish this objective, I deploy different strategies adapted to the nature of a particular sample and I use up-to-date curve fitting procedures. Similarly, I’m aware of the limitations of XPS for extracting certain information. This philosophy often leads to put a considerable amount of information concluded from recent XPS analysis into question.
Although I analyze a wide range of morphologies and compositions of materials, my more recent activity concerns the analysis of extremely small nanoparticles (1 – 2 nm) functionalized with organic ligands to prevent aggregation. Under these conditions, XPS is not a surface analytical technique which makes more challenging extraction reliable information from data. This part of my research is carried out in collaboration with the Seloxcat group of the Universitat Autònoma de Barcelona (UAB).
The research axe Reliable surface analysis is supported by the Surface Analysis Unit of the ICB laboratory (Dr. Olivier Heintz and Dr. Anna Sobolewska) which has a cutting-edge XPS instrument with Al Kα and Cr Kα sources and a ToF-SIMS instrument.
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I earned my PhD in 2013 at the Institute of Chemical Research of Catalonia (ICIQ) and the Universitat Rovira i Virgili (URV), in Tarragona (Spain), working under the supervision of Prof. Antoni Llobet in the study of new water oxidation electrocatalysts. After a short postdoc at the same institute, I moved to the Université de Bretagne Occidentale (UBO), in Brest (France), to carry out a second postdoc between 2014 and 2017. My research activities mainly concerned the development of electrochemical and spectroelectrochemical methods aimed at studying the redox properties of bioinorganic Cu-O2 complexes at very low temperatures (T ≤ -70°C). Then, I moved to the Université d’Angers (UA), where I made a third postdoc between 2017 and 2019. During that period, I focused on unravelling the molecular routes allowing to control the functionalization of conducting surfaces via the electrochemically triggered grafting of diazonium salts. Between 2019 and 2021, I carried out a fourth postdoc at the Université de Pau et des pays de l’Adour (UPPA) where my research activities relied on the development of reliable procedures enabling the analysis of interphases in Li solid state batteries by x-ray photoelectron spectroscopy (XPS), ToF-SIMS and Auger spectroscopies. Finally, I was recruited as maître de conferences (associate professor) at the Université de Bourgogne (UB), in Dijon (France), in 2021.
[/kc_column_text][/kc_tab][kc_tab title="Research Activities" _id="217"][kc_column_text _id="567539" css_custom="{`kc-css`:{}}"]1) Reliable surface analysis.
Nowadays there is a real crisis about the actual validity of most of published surface analysis data of materials by x-ray photoelectron spectroscopy (XPS). This issue comprises the preparation of the sample, the procedure of signal recording and, of course, the interpretation of the data. An overview on these problems can be gained from the next publications: 10.1002/anie.201916000, 10.1116/6.0000685, 10.1017/S1431927619015332.
Bearing this situation in mind, one of my main research activities is devoted to the reliable analysis of the surface of materials by XPS. My approach comprises all the steps necessaries for extracting useful information from XPS data. In order to accomplish this objective, I deploy different strategies adapted to the nature of a particular sample and I use up-to-date curve fitting procedures. Similarly, I’m aware of the limitations of XPS for extracting certain information. This philosophy often leads to put a considerable amount of information concluded from recent XPS analysis into question.
Although I analyze a wide range of morphologies and compositions of materials, my more recent activity concerns the analysis of extremely small nanoparticles (1 – 2 nm) functionalized with organic ligands to prevent aggregation. Under these conditions, XPS is not a surface analytical technique which makes more challenging extraction reliable information from data. This part of my research is carried out in collaboration with the Seloxcat group of the Universitat Autònoma de Barcelona (UAB).
The research axe Reliable surface analysis is supported by the Surface Analysis Unit of the ICB laboratory (Dr. Olivier Heintz and Dr. Anna Sobolewska) which has a cutting-edge XPS instrument with Al Kα and Cr Kα sources and a ToF-SIMS instrument.
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